Your shopping cart is currently empty.
Electrostatic Force Microscopy (EFM)
Electrostatic Force Microscopy (EFM) uses a combination of TappingMode™, LiftMode™and a conductive afm tip to provide information pertaining to the electric field above a conductive sample. Each sample line is scanned using TappingMode to obtain topography data first. This topographic information is stored and retraced with a height offset in LiftMode, and the electrical data is then collected.
Frequency
Nom: 75KHz
Spring Const.
Nom: 3.0N/m
Geometry
Rectangular
Tip Radius
25nmMaterial
0.01 - 0.025 Ωcm Antimony (n) doped SiCoating
PtIrF: Conductive PtIr
B: Reflective PtIr
Frequency
Nom: 75KHz
Spring Const.
Nom: 3.0N/m
Geometry
Rectangular
Tip Radius
25nmMaterial
0.01 - 0.025 Ωcm Antimony (n) doped SiCoating
MagneticF: Magnetic CoCr
B: Reflective CoCr
Frequency
Nom: 10KHz
Spring Const.
Nom: 0.10N/m
Geometry
Rectangular
Tip Radius
25nmMaterial
0.01 - 0.025 Ωcm Antimony (n) doped SiCoating
PtIrF: Conductive PtIr
B: Reflective PtIr
Frequency
Nom: 20KHz
Spring Const.
Nom: 18N/m
Geometry
Rectangular
Tip Radius
<20nmMaterial
Solid Platinum
Frequency
Nom: 150KHz
Spring Const.
Nom: 5N/m
Geometry
Rectangular
Tip Radius
35nmMaterial
0.01 - 0.025 Ωcm Antimony (n) doped SiCoating
F: Magnetic CoCr
B: Reflective CoCr
Frequency
Nom: 105KHz
Spring Const.
Nom: 6N/m
Geometry
Rectangular
Tip Radius
100nmMaterial
0.010-0.025 Ωcm Antimony (n) doped SiCoating
Conductive DiamondF: Conductive Diamond
B: Reflective Aluminum
Frequency
Nom: 75KHz
Spring Const.
Nom: 3.0N/m
Geometry
Rectangular
Tip Radius
80nmMaterial
0.01 - 0.025 Ωcm Antimony (n) doped SiCoating
MagneticF: Magnetic CoCr
B: Reflective CoCr
Frequency
Nom: 9KHz
Spring Const.
Nom: 0.8N/m
Geometry
Rectangular
Tip Radius
<20nmMaterial
Solid Platinum
Frequency
Nom: 5KHz
Spring Const.
Nom: 0.3N/m
Geometry
Rectangular
Tip Radius
<20nmMaterial
Solid Platinum
Frequency
Nom: 8KHz
Spring Const.
Nom: 10N/m
Geometry
Rectangular
Tip Radius
<20nmMaterial
Solid Platinum