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RMN-12PT400B
Geometry
RectangularFrequency (KHz)
Nom: 5
Min: 3
Max: 7
Length (µm)
Nom: 400
Min: 350
Max: 450
Spring Const (N/m)
Nom: 0.3
Min: 0.18
Max: 0.42
Width (µm)
Nom: 60
Min: 50
Max: 70
Order a free RMN-12PT400B sample
Price: $900.00 (USD)
Sold in packs of 10
Questions? Free, Online Consulting
Overview
Solid Metal Probe, 0.3 N/m, 5 kHz
Rocky Mountain Nanotechnology (RMN) probes are uniquely constructed from pure platinum and placed on a standard AFM probe sized ceramic substrate. Solid metal probes offer excellent conductivity and suffer no thin-film adhesion problems that occur with metal-coated silicon probes. These probes also have a tip radius (< 20 nm) which is difficult to routinely obtain by standard AFM probe processing methods. These probes are ideal for C-AFM, SCM, and KPFM/EFM applications. They are available in a range of spring constants. Each probe tip is individually imaged by FE-SEM to verify that the metallic probe tip radius is below 20nm.
Rocky Mountain Nanotechnology (RMN) probes are uniquely constructed from pure platinum and placed on a standard AFM probe sized ceramic substrate. Solid metal probes offer excellent conductivity and suffer no thin-film adhesion problems that occur with metal-coated silicon probes. These probes also have a tip radius (< 20 nm) which is difficult to routinely obtain by standard AFM probe processing methods. These probes are ideal for C-AFM, SCM, and KPFM/EFM applications. They are available in a range of spring constants. Each probe tip is individually imaged by FE-SEM to verify that the metallic probe tip radius is below 20nm.
Tip Specification
Tip Height (h): ~100 µm
Cantilever Specification
Material: Solid Platinum
Geometry: Rectangular
Cantilevers Number: 1