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RMN-12PT300B

RMN-12PT300B
Geometry
Rectangular
Frequency (KHz)
Nom: 9
Min: 6
Max: 12
Length (µm)
Nom: 300
Min: 350
Max: 250
Spring Const (N/m)
Nom: 0.8
Min: 0.48
Max: 1.12
Width (µm)
Nom: 60
Min: 50
Max: 70
3 Total Related Products
RMN-12PT400B
Solid Metal Probe, 0.3 N/m, 5 kHz

Rocky Mountain Nanotechnology (RMN) probes are uniquely constructed from pure platinum and placed on a standard AFM probe sized ceramic substrate.  Solid metal probes offer excellent conductivity and suffer no thin-film adhesion problems that occur with metal-coated silicon probes. These probes also have a tip radius (< 20 nm) which is difficult to routinely obtain by standard AFM probe processing methods.  These probes are ideal for C-AFM, SCM, and KPFM/EFM applications. They are available in a range of spring constants. Each probe tip is individually imaged by FE-SEM to verify that the metallic probe tip radius is below 20nm.   View...
RMN-25PT300B
Solid Metal Probe, 18 N/m, 20 kHz

Rocky Mountain Nanotechnology (RMN) probes are uniquely constructed from pure platinum and placed on a standard AFM probe sized ceramic substrate. Solid metal probes offer excellent conductivity and suffer no thin-film adhesion problems that occur with metal-coated silicon probes. These probes also have a tip radius (< 20 nm) which is difficult to routinely obtain by standard AFM probe processing methods.  These probes are ideal for C-AFM, SCM, and KPFM/EFM applications. They are available in a range of spring constants. Each probe tip is individually imaged by FE-SEM to verify that the metallic probe tip radius is below 20nm.   View...
RMN-25PT400B
Solid Metal Probe, 8 N/m, 10 kHz

Rocky Mountain Nanotechnology (RMN) probes are uniquely constructed from pure platinum and placed on a standard AFM probe sized ceramic substrate. Solid metal probes offer excellent conductivity and suffer no thin-film adhesion problems that occur with metal-coated silicon probes. These probes also have a tip radius (< 20 nm) which is difficult to routinely obtain by standard AFM probe processing methods.  These probes are ideal for C-AFM, SCM, and KPFM/EFM applications. They are available in a range of spring constants. Each probe tip is individually imaged by FE-SEM to verify that the metallic probe tip radius is below 20nm.View...
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Overview

Solid Metal Probe, 0.8 N/m, 9 kHz

Rocky Mountain Nanotechnology (RMN) probes are uniquely constructed from pure platinum and placed on a standard AFM probe sized ceramic substrate. Solid metal probes offer excellent conductivity and suffer no thin-film adhesion problems that occur with metal-coated silicon probes. These probes also have a tip radius (< 20 nm) which is difficult to routinely obtain by standard AFM probe processing methods. 

These probes are ideal for C-AFM, SCM, and KPFM/EFM applications.

They are available in a range of spring constants. Each probe tip is individually imaged by FE-SEM to verify that the metallic probe tip radius is below 20nm.  


Tip Specification
RMN-12PT300B Tip Image
Tip Height (h): ~100 µm
Cantilever Specification
RMN-12PT300B Cantilever Image
Material: Solid Platinum
Geometry: Rectangular
Cantilevers Number: 1
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