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Piezoresponse/ Piezoforce Microscopy (PFM)
Piezoforce Microscopy (PFM) is a technique based on contact mode. PFM identifies the inverse piezoelectric effect of a sample by electrically stimulating the sample so the topographic response of the sample can be monitored by lock-in techniques. Amplitude and phase information show details such as the strength and direction of the polarization on the sample.
Frequency
Nom: 75KHz
Spring Const.
Nom: 3.0N/m
Geometry
Rectangular
Tip Radius
25nmMaterial
0.01 - 0.025 Ωcm Antimony (n) doped SiCoating
PtIrF: Conductive PtIr
B: Reflective PtIr
Frequency
Nom: 75KHz
Spring Const.
Nom: 3.0N/m
Geometry
Rectangular
Tip Radius
25nmMaterial
0.01 - 0.025 Ωcm Antimony (n) doped SiCoating
MagneticF: Magnetic CoCr
B: Reflective CoCr
Frequency
Nom: 10KHz
Spring Const.
Nom: 0.10N/m
Geometry
Rectangular
Tip Radius
25nmMaterial
0.01 - 0.025 Ωcm Antimony (n) doped SiCoating
PtIrF: Conductive PtIr
B: Reflective PtIr
Frequency
Nom: 20KHz
Spring Const.
Nom: 18N/m
Geometry
Rectangular
Tip Radius
<20nmMaterial
Solid Platinum
Frequency
Nom: 150KHz
Spring Const.
Nom: 5N/m
Geometry
Rectangular
Tip Radius
35nmMaterial
0.01 - 0.025 Ωcm Antimony (n) doped SiCoating
F: Magnetic CoCr
B: Reflective CoCr
Frequency
Nom: 9KHz
Spring Const.
Nom: 0.8N/m
Geometry
Rectangular
Tip Radius
<20nmMaterial
Solid Platinum
Frequency
Nom: 5KHz
Spring Const.
Nom: 0.3N/m
Geometry
Rectangular
Tip Radius
<20nmMaterial
Solid Platinum
Frequency
Nom: 8KHz
Spring Const.
Nom: 10N/m
Geometry
Rectangular
Tip Radius
<20nmMaterial
Solid Platinum
Frequency
Nom: 75KHz
Spring Const.
Nom: 2.8N/m
Geometry
Rectangular
Tip Radius
25-80nmMaterial
0.01 - 0.025 Ωcm Antimony (n) doped SiCoating
MagneticF: Magnetic