FMV-PT

Bruker's PeakForce KPFM probes, 10-pack.  300 kHz, 0.8 N/m.

A 10-pack of sharp nitride lever probes ideally suited for Peak Force Quantitative Nano-Electric measurements.  These probes are tailored for specific high resolution electrical measurements by matching the softness of a nitride cantilever with the sharpness of an uncoated silicon probe.
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A pack of Conductive Silicon Probes. 

Bruker's Value Line Probe for Electrical Characterization using Contact Mode in air.

Specifications:
- Tip radius of 25 nm nominal.
- Platinum-Iridium coated, electrically conductive tip that is ideal for various electrical characterization applications.
-The Pt-Ir coating on the front side of the cantilever provides a metallic electrical path from the cantilever die to the apex of the tip.
- The coating on the back side of the cantilever enhances laser reflectivity.
- Unmounted for all AFMs.View...

For the highest resolution nanoelectrical measurements with outstanding wear resistance.

Bruker's platinum silicide AFM probe is the ideal choice for Scanning Capacitance Microscopy measurements, conductivity measurements (Conductive AFM (C-AFM) and PeakForce TUNA), Electrical Force Microscopy (EFM), and other characterization applications. on the most advanced semiconductor features, providing the highest resolution imaging and long tip lifetime due to its outstanding wear resistant properties. 

The Bruker SCM-PtSi probe provides:

• High resolution electrical imaging with an ultra-sharp conductive tip
• Consistent performance with high measurement lifetime
• Highly sensitive nanoelectrical measurements

Bruker Atomic Force Microscopy group also provides many other nano-electrical probes and modes for AFM based electrical measurements including our unique PeakForce KPFM & PeakForce TUNA modes.

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