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MESP-V2

MESP-V2
Geometry
Rectangular
Tip Radius (nm)
Nom: 35
Max: 50
Frequency (KHz)
Nom: 75
Min: 50
Max: 100
Length (µm)
Nom: 225
Min: 215
Max: 235
Spring Const (N/m)
Nom: 3.0
Min: 1.5
Max: 6.0
Width (µm)
Nom: 35
Min: 33
Max: 37
3 Total Related Products
MESP-RC-V2

Built on the high-performance RTESP-150 AFM probe, the MESP-RC-V2's hard Cobalt-Chromium coating is tailored for high-sensitivity and magnetic contrast.  This cost-effective probe has a nominal tip radius of 35 nm for excellent lateral resolution for MFM, as well as other electrical and capacitance applications requiring a cantilever with conductive coating. 

The MESP-RC-V2 has a nominal coercivity of 400 Oe (medium), and a magnetic moment of 1e-13 EMU (medium). 

The reflex side of the cantilever has a Co-Cr coating for increased reflectivity up to 2.5 times that of an uncoated probe.

The new design provides:
• Tighter dimensional specifications for improved probe to probe consistency
• Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
• Improved probe quality & aesthetics
View...
MESP-LM-V2

Bruker's MESP-LM-V2 is the established choice for Magnetic Force Microscopy.  Built on the high-performance RFESP-75 AFM probe, the hard Cobalt-Chromium coating on this tip is tailored for high-sensitivity and magnetic contrast.  This cost-effective probe has a nominal tip radius of 25 nm for excellent lateral resolution for MFM, as well as other electrical and capacitance applications requiring a cantilever with conductive coating. 

The MESP-LM-V2 has a nominal coercivity of <400 Oe (medium/low), and a magnetic moment of 0.3e-13 EMU (low). 

The reflex side of the cantilever has a Co-Cr coating for increased reflectivity up to 2.5 times that of an uncoated probe.

The new design provides:
• Tighter dimensional specifications for improved probe to probe consistency
• Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
• Improved probe quality & aesthetics
View...
MESP-HM-V2
Bruker's MESP-HM-V2 is the established choice for Magnetic Force Microscopy.  Built on the high-performance RFESP-75 AFM probe, the hard Cobalt-Chromium coating on this tip is tailored for high-sensitivity and magnetic contrast.  This cost-effective probe has a nominal tip radius of 80 nm for excellent lateral resolution for MFM, as well as other electrical and capacitance applications requiring a cantilever with conductive coating. 

The MESP-HM-V2 has a nominal coercivity of 400 Oe (medium), and a magnetic moment of 3e-13 EMU (high). 

The reflex side of the cantilever has a Co-Cr coating for increased reflectivity up to 2.5 times that of an uncoated probe.

Bruker's MESP-HM-V2 probe replaces the legacy MESP-HM probe. Bruker recommends transitioning to this probe.  
The MESP-HM-V2 design provides:
• Tighter dimensional specifications for improved probe to probe consistency
• Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
• Improved probe quality & aesthetics
View...
Order a free MESP-V2 sample
Price: $715.00 (USD)
Sold in packs of 10
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Overview

Bruker's MESP-V2 magnetic probe is the industry standard for MFM imaging!

 

The hard Cobalt-Chrome coating on the tip is tailored for highly sensitive magnetic contrast and has a nominal coercivity of 400 Oe (medium) and a magnetic moment of 1e-13 EMU(medium). The 75khz cantilever frequency, 3N/m spring constant and ~35nm tip radius are optimal for use with dual pass, tapping based, MFM modes available as standard on most AFMs

 

Probe part numbers ending in -V2 provide:

Tighter dimensional specifications for improved probe to probe consistency

More precise alignment of the tip to the cantilever apex

Improved aesthetics

Tip Specification
MESP-V2 Tip Image
This probe uses a rotated tip to provide a more symmetric representation of features over 200nm.
Tip Height (h): 10 - 15 µm
Front Angle (FA): 17.5 ± 2.5º
Back Angle (BA): 25 ± 2.5º
Side Angle (SA): 20 ± 2.5º
Cantilever Specification
MESP-V2 Cantilever Image
The Cobalt-Chromium reflective coating on the backside of the cantilever increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers (< 2.5 µm), highly reflective samples, and machine vision applications.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2.80µm
Cantilever Thickness (RNG): 2.05 - 3.55µm
Back Side Coating: Reflective CoCr
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