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MESP-LM-V2
Geometry
RectangularTip Radius (nm)
Nom: 25
Max: 35
Frequency (KHz)
Nom: 75
Min: 50
Max: 100
Length (µm)
Nom: 225
Min: 215
Max: 235
Spring Const (N/m)
Nom: 3.0
Min: 1.5
Max: 6.0
Width (µm)
Nom: 35
Min: 33
Max: 37
Order a free MESP-LM-V2 sample
Price: $797.50 (USD)
Sold in packs of 10
Questions? Free, Online Consulting
Overview
Bruker's MESP-LM-V2 is the established choice for Magnetic Force Microscopy. Built on the high-performance RFESP-75 AFM probe, the hard Cobalt-Chromium coating on this tip is tailored for high-sensitivity and magnetic contrast. This cost-effective probe has a nominal tip radius of 25 nm for excellent lateral resolution for MFM, as well as other electrical and capacitance applications requiring a cantilever with conductive coating.
The MESP-LM-V2 has a nominal coercivity of <400 Oe (medium/low), and a magnetic moment of 0.3e-13 EMU (low).
The reflex side of the cantilever has a Co-Cr coating for increased reflectivity up to 2.5 times that of an uncoated probe.
The new design provides:
• Tighter dimensional specifications for improved probe to probe consistency
• Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
• Improved probe quality & aesthetics
Tip Specification
Cantilever Specification
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2.80µm
Cantilever Thickness (RNG): 2.05 - 3.55µm
Back Side Coating: Reflective CoCr