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DDESP-V2

DDESP-V2
Geometry
Rectangular
Tip Radius (nm)
Nom: 100
Max: 150
Frequency (KHz)
Nom: 450
Min: 300
Max: 600
Length (µm)
Nom: 125
Min: 115
Max: 135
Spring Const (N/m)
Nom: 80
Min: 30
Max: 180
Width (µm)
Nom: 40
Min: 38
Max: 42
2 Total Related Products
SCM-PTSI
For the highest resolution nanoelectrical measurements with outstanding wear resistance.

Bruker's platinum silicide AFM probe is the ideal choice for Scanning Capacitance Microscopy measurements, conductivity measurements (Conductive AFM (C-AFM) and PeakForce TUNA), Electrical Force Microscopy (EFM), and other characterization applications. on the most advanced semiconductor features, providing the highest resolution imaging and long tip lifetime due to its outstanding wear resistant properties. 

The Bruker SCM-PtSi probe provides:

• High resolution electrical imaging with an ultra-sharp conductive tip
• Consistent performance with high measurement lifetime
• Highly sensitive nanoelectrical measurements

Bruker Atomic Force Microscopy group also provides many other nano-electrical probes and modes for AFM based electrical measurements including our unique PeakForce KPFM & PeakForce TUNA modes.


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DDESP-FM-V2

Bruker's popular DDESP-FM-V2 electrical probe provide both fantastic wear resistance and robust conductivity due to the hard and highly conductive tip side doped diamond coating.

 

Perfect for applications such as C-AFM and PeakForce TUNA, SCM, SSRM, and PFM.

 

For a stiffer cantilever version of this probe see DDESP-V2.

 

Probe part numbers ending in -V2 provide:

Tighter dimensional specifications for improved probe to probe consistency

More precise alignment of the tip to the cantilever apex

Improved aesthetics

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Order a free DDESP-V2 sample
Price: $1,400.00 (USD)
Sold in packs of 10
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Probe Selection Guide
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Questions? Free, Online Consulting
+1 (800) 715-8440
Overview

Bruker's popular DDESP-V2 electrical probe provide both fantastic wear resistance and robust conductivity due to the hard and highly conductive tip side doped diamond coating.

 

Perfect for applications such as C-AFM and PeakForce TUNA, SCM, SSRM, and PFM.

 

For a softer cantilever version of this probe see DDESP-FM-V2

 

Probe part numbers ending in -V2 provide:

Tighter dimensional specifications for improved probe to probe consistency

More precise alignment of the tip to the cantilever apex

Improved aesthetics

Tip Specification
DDESP-V2 Tip Image
The doped diamond coating is used to harden the tip in applications that require both increased wear resistance and a conductive tip. The tradeoff for the increased lifetime is that the coating also increases the diameter of the tip. If a conductive coating is not needed, the DLC coated probes (Model# TESPD) provide a cost effective alternative.
Tip Height (h): 10 - 15 µm
Front Angle (FA): 25 ± 2.5º
Back Angle (BA): 17.5 ± 2.5º
Side Angle (SA): 20 ± 2.5º
Cantilever Specification
DDESP-V2 Cantilever Image
The Aluminum reflective coating on the backside of the cantilever increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers (< 2.5 µm), highly reflective samples, and machine vision applications.
Material: 0.010-0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3.6µm
Cantilever Thickness (RNG): 2.85 - 4.35µm
Back Side Coating: Reflective Aluminum
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