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Tapping MPP - Rotated
The MPP Tapping cantilevers are designed for high resolution imaging in non-contact or TappingMode. These probes, identical in tip sharpness and cantilever geometry to the standard Multi MPP probes, have a 180° rotated tip that provides a more symmetric representation of features over 200nm than the standard tip. The rotated versions of Veeco's flagship MPP probes are an excellent choice for high sensitivity silicon probe imaging.
Frequency
Nom: 300KHz
Spring Const.
Nom: 40N/m
Geometry
Rectangular
Tip Radius
8nmMaterial
0.01 - 0.025 Ωcm Antimony (n) doped SiCoating
B: Reflective Aluminum
Frequency
Nom: 150KHz
Spring Const.
Nom: 5N/m
Geometry
Rectangular
Tip Radius
8nmMaterial
0.01 - 0.025 Ωcm Antimony (n) doped SiCoating
B: Reflective Aluminum
Frequency
Nom: 525KHz
Spring Const.
Nom: 200N/m
Geometry
Rectangular
Tip Radius
8nmMaterial
0.01 - 0.025 Ωcm Antimony (n) doped SiCoating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 40N/m
Geometry
Rectangular
Tip Radius
8nmMaterial
0.01 - 0.025 Ωcm Antimony (n) doped Si
Frequency
Nom: 300KHz
Spring Const.
Nom: 40N/m
Geometry
Rectangular
Tip Radius
30nmMaterial
0.01 - 0.025 Ωcm Antimony (n) doped SiCoating
B: Reflective Aluminum
Frequency
Nom: 525KHz
Spring Const.
Nom: 200N/m
Geometry
Rectangular
Tip Radius
30nmMaterial
0.01 - 0.025 Ωcm Antimony (n) doped SiCoating
B: Reflective Aluminum
Frequency
Nom: 150KHz
Spring Const.
Nom: 5N/m
Geometry
Rectangular
Tip Radius
30nmMaterial
0.01 - 0.025 Ωcm Antimony (n) doped SiCoating
B: Reflective Aluminum
Frequency
Nom: 190KHz
Spring Const.
Nom: 35N/m
Geometry
Rectangular
Tip Radius
8nmMaterial
0.01 - 0.025 Ωcm Antimony (n) doped SiCoating
B: Reflective Aluminum
Frequency
Nom: 20KHz
Spring Const.
Nom: 0.9N/m
Geometry
Rectangular
Tip Radius
8nmMaterial
0.01 - 0.025 Ωcm Antimony (n) doped Si
Frequency
Nom: 75KHz
Spring Const.
Nom: 3N/m
Geometry
Rectangular
Tip Radius
8nmMaterial
0.01 - 0.025 Ωcm Antimony (n) doped SiCoating
B: Reflective Aluminum