RTESP-525

Hand-crafted natural diamond Nanoindenting tip. 
- Mounted for the Dimension AFM.
- Quantity = 1
- Specific spring constant range can be requested as a special order for added cost.  Contact your local Bruker representative for more information.View...

Hand-crafted natural diamond Nanoindenting tip. 
- Mounted for the Dimension AFM.
- High spring constant range.
- Quantity = 1
- Specific spring constant range can be requested as a special order for added cost.  Contact your local Bruker representative for more information.View...

A pack of 10 High quality etched silicon probes for hard TappingMode™ and other non-contact modes.  Unmounted for use on standard AFM's.

Bruker's probes are the preferred choice for high-sensitivity silicon probe imaging in TappingMode or non-contact mode in air.  Every aspect of the probe design has been optimized to provide the most accurate profiling of microscopic features.  With precisely controlled cantilever geometry to enable repeatable scanning parameters, an extra sharp tip radius to reduce the AFM's minimum detectable feature size, and a taller tip to minimize squeeze film damping, Bruker is the industry standard for high-performance and high-quality imaging on a wide variety of sample types. 

The new design provides:
•         Tighter dimensional specifications for improved probe to probe consistency
•         Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
•         Improved probe quality & aesthetics  

This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model RTESP-525. Download the datasheet to learn more.

 

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