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RFESP-75
Geometry
RectangularTip Radius (nm)
Nom: 8
Max: 12
Frequency (KHz)
Nom: 75
Min: 50
Max: 100
Length (µm)
Nom: 225
Min: 215
Max: 235
Spring Const (N/m)
Nom: 3
Min: 1.5
Max: 6
Width (µm)
Nom: 35
Min: 33
Max: 37
Order a free RFESP-75 sample
Price: $393.75 (USD)
Sold in packs of 10
Questions? Free, Online Consulting
Overview
A pack of 10 High quality etched silicon probes for soft TappingMode™ imaging and force modulation in air. Unmounted for use on standard AFM's.
Bruker's flagship MPP probes are the preferred choice for high-sensitivity silicon probe imaging in TappingMode or non-contact mode in air. Every aspect of the MPP design has been optimized to provide the most accurate profiling of microscopic features. With precisely controlled cantilever geometry to enable repeatable scanning parameters, an extra sharp tip radius to reduce the AFM's minimum detectable feature size, and a taller tip to minimize squeeze film damping, the MPP is the industry standard for high-performance and high-quality imaging on a wide variety of sample types.
The new design provides:
• Tighter dimensional specifications for improved probe to probe consistency
• Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
• Improved probe quality & aesthetics
This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model RFESPA-75.
Bruker's flagship MPP probes are the preferred choice for high-sensitivity silicon probe imaging in TappingMode or non-contact mode in air. Every aspect of the MPP design has been optimized to provide the most accurate profiling of microscopic features. With precisely controlled cantilever geometry to enable repeatable scanning parameters, an extra sharp tip radius to reduce the AFM's minimum detectable feature size, and a taller tip to minimize squeeze film damping, the MPP is the industry standard for high-performance and high-quality imaging on a wide variety of sample types.
The new design provides:
• Tighter dimensional specifications for improved probe to probe consistency
• Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
• Improved probe quality & aesthetics
This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model RFESPA-75.
Tip Specification
Tip Height (h): 10 - 15 µm
Front Angle (FA): 15 ± 2º
Back Angle (BA): 25 ± 2º
Side Angle (SA): 17.5 ± 2º
Cantilever Specification
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2.8µm
Cantilever Thickness (RNG): 2.05 - 3.55 3.55µm