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Probes → Modes and Applications → Electrical Applications → Electrostatic Force Microscopy (EFM)

Electrostatic Force Microscopy (EFM)

Popular
Unique
DDESP-V2
DDESP-V2
Frequency
Nom: 450KHz
Spring Const.
Nom: 80N/m
Geometry
Rectangular
Tip Radius
100nm
Material
0.010-0.025 Ωcm Antimony (n) doped Si
Coating
Conductive Diamond
F: Conductive Diamond
B: Reflective Aluminum
Details
Popular
High Performance
FESPA-V2
FESPA-V2
Frequency
Nom: 75KHz
Spring Const.
Nom: 2.8N/m
Geometry
Rectangular
Tip Radius
8nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Details
Popular
High Performance
DDESP-FM-V2
DDESP-FM-V2
Frequency
Nom: 105KHz
Spring Const.
Nom: 6N/m
Geometry
Rectangular
Tip Radius
100nm
Material
0.010-0.025 Ωcm Antimony (n) doped Si
Coating
Conductive Diamond
F: Conductive Diamond
B: Reflective Aluminum
Details
FMV
FMV
Frequency
Nom: 75KHz
Spring Const.
Nom: 2.8N/m
Geometry
Rectangular
Tip Radius
8nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Details
FESP-V2
FESP-V2
Frequency
Nom: 75KHz
Spring Const.
Nom: 2.8N/m
Geometry
Rectangular
Tip Radius
8nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
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NCLV
NCLV
Frequency
Nom: 190KHz
Spring Const.
Nom: 48N/m
Geometry
Rectangular
Tip Radius
8nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Details
LTESPA-V2
LTESPA-V2
Frequency
Nom: 190KHz
Spring Const.
Nom: 48N/m
Geometry
Rectangular
Tip Radius
8nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Details
LTESP-V2
LTESP-V2
Frequency
Nom: 190KHz
Spring Const.
Nom: 48N/m
Geometry
Rectangular
Tip Radius
8nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Details
Popular
New
OLTESPA-R4
OLTESPA-R4
Frequency
Nom: 70KHz
Spring Const.
Nom: 2N/m
Geometry
Rectangular
Tip Radius
7.0nm
Material
0.01 - 0.02 Ωcm Silicon
Coating
B: Reflective Al
Details
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