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LTESP-V2
Geometry
RectangularTip Radius (nm)
Nom: 8
Max: 12
Frequency (KHz)
Nom: 190
Min: 130
Max: 250
Length (µm)
Nom: 225
Min: 215
Max: 235
Spring Const (N/m)
Nom: 48
Min: 24
Max: 96
Width (µm)
Nom: 40
Min: 38
Max: 42
Order a free LTESP-V2 sample
Price: $357.00 (USD)
Sold in packs of 10
Questions? Free, Online Consulting
Overview
A pack of 10 High quality long-lever etched silicon probes for TappingMode™ and other non-contact modes. Unmounted for use on standard AFM's.
Bruker’s line of LTESP high quality premium etched silicon probes set the industry standard for long-lever TappingMode™ and non-contact mode in air.
The new design provides:
• Tighter dimensional specifications for improved probe to probe consistency
• Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
• Improved probe quality & aesthetics
This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model LTESPA-V2.
Bruker’s line of LTESP high quality premium etched silicon probes set the industry standard for long-lever TappingMode™ and non-contact mode in air.
The new design provides:
• Tighter dimensional specifications for improved probe to probe consistency
• Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
• Improved probe quality & aesthetics
This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model LTESPA-V2.
Tip Specification
Tip Height (h): 10 - 15 µm
Front Angle (FA): 25 ± 2.5º
Back Angle (BA): 15 ± 2.5º
Side Angle (SA): 22.5 ± 2.5º
Cantilever Specification
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 6.8µm
Cantilever Thickness (RNG): 5.8 - 7.8µm