By AFM

SD-103

SPM cross-sectional sample holder

00-107-0141

EFM Test Sample on 18 mm Puck for Innova and CP/CP-II; This sample is conductive and allows a bias potential to be applied between the tip and sample. This allows an E-field to be imaged in Lift Mode.

PSH-103

Micro-vise sample holder for polymer & other soft materials

MMTMEC

Electrochemistry TappingMode fluid cell

SPRING-L

Replacement scanner springs for AS-130 and AS-200 type scanners

SPRING-S

Replacement scanner springs for AS-0.5 and AS-12 type scanners

PFQNM-SMPKIT-12M

Peak Force QNM Sample Kit, Samples on 12mm discs

PRSIC-10

Fluid Cantilever Holder Splash Guard for the Dimension ICON SPM

VGRP-UM

Calibration artifact: 180nm step height, 10µm pitch

EC-V2-COVER GLASS

Cover Glass for Second Generation Dimension EC Cell

820-017-300

MultiMode Application Module Signal Access Wire

DMFM-START

MFM starter kit for Dimension series SPMs

DSTM

STM tip holder for Dimension 3000 & 5000 series SPMs

VGRP-15M

Calibration Artifact: 180nm Depth, 10μm Pitch, Pt Coated, on 15mm Puck

SSRM-SMPL-P

Unmounted p-type staircase SSRM sample