SPM Accessories
EFM Test Sample on 18 mm Puck for Innova and CP/CP-II; This sample is conductive and allows a bias potential to be applied between the tip and sample. This allows an E-field to be imaged in Lift Mode.
EFM Test Sample on 18 mm Puck for Innova and CP/CP-II; This sample is conductive and allows a bias potential to be applied between the tip and sample. This allows an E-field to be imaged in Lift Mode.