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TESPA-V2-SS

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Geometry
Rectangular
Tip Radius (nm)
Nom: 2
Max: 5
Frequency (KHz)
Nom: 320
Min: 270
Max: 370
Length (µm)
Nom: 123
Min: 120
Max: 125
Spring Const (N/m)
Nom: 37
Min: 19
Max: 55
Width (µm)
Nom: 40
Min: 37
Max: 42
3 Total Related Products
TESPA-HAR
42N/m, 320kHz, High Aspect Ratio Tip (5:1), Aluminum Reflective Coating

High aspect ratio (HAR) probes are based upon Bruker technology and made from Bruker TESP probes using focused ion beam milling techniques.  The HAR process modifies the top portion of the tip to an aspect ratio of at least 5:1.  These probes are ideal for Tappingmode imaging on samples with tall/deep geometries, such as semiconductor trench imaging.
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TESPA-V2

TESPA-V2 is our best performing, best selling, non-rotated tapping mode probe! An industry standard ~300kHz, ~40N/m, ~100um long, Al coated rectangular cantilever paired with a 15um tall and 8nm radius tip. Get the best tapping mode topography and phase images on everything from polymers to ceramics, metals to semiconductors. Compatible with all AFMs.

 

Probe part numbers ending in -V2 provide:

Tighter dimensional specifications for improved probe to probe consistency

More precise alignment of the tip to the cantilever apex

Improved aesthetics


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TESP-V2-SS

Super Sharp TESP probe based off of our TESP-V2 probe with super sharp spike tip.  The small spike Si processed to <10 degree half angles for the first 200 nm of the tip apex.

  • 42 N/m, 320 kHz
  • 2-5nm Tip Radius of Curvature
  • 10-pack of probes.

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Price: $756.00 (USD)
Sold in packs of 10
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Probe Selection Guide
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Overview
TESPA-V2-SS, SUPERSHARP, 10-PACK.  Pack of 10 High quality etched silicon probes with backside Aluminum reflex coating, for TappingMode™ and other non-contact modes. Unmounted for use on standard AFMs.

 

Super Sharp TESPA probe based off of our TESPA-V2 probe combines the high consistency of the V2 design with a high aspect ratio, supersharp tip guaranteed by Bruker's proprietary process. The small spike is processed to < 10 degree half angles for the first 200 nm of the tip apex.
  • 42 N/m, 320 kHz
  • 2-5 nm tip radius of curvature
  • 10-pack of probes
 
Tip Specification
TESPA-V2-SS Tip Image
2-5 nm tip radius of curvature. Super sharp spike tip. The small spike is silicon tip processed to <10deg half angles for the first 200 nm of the tip apex.
Tip Height (h): 12.5 µm
Front Angle (FA): 25.0º
Back Angle (BA): 17.5º
Side Angle (SA): 20.0º
Cantilever Specification
TESPA-V2-SS Cantilever Image
Aluminum reflective coating on the backside of the cantilever. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers, highly reflective samples, and machine vision applications.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3.3µm
Cantilever Thickness (RNG): 2.8 - 3.8µm
Back Side Coating: Reflective Aluminum
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