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Probes → TESP-V2-SS

TESP-V2-SS

TESP-V2 View Larger
Geometry
Rectangular
Tip Radius (nm)
Nom: 2
Max: 5
Frequency (KHz)
Nom: 320
Min: 270
Max: 370
Length (µm)
Nom: 123
Min: 120
Max: 125
Spring Const (N/m)
Nom: 37
Min: 19
Max: 55
Width (µm)
Nom: 40
Min: 37
Max: 42
3 Total Related Products
TESP-HAR
42N/m, 320kHz, High Aspect Ratio (5:1), No Reflecting CoatingView...
TESP-V2

TESP-V2 is our best performing, best selling, non-rotated tapping mode probe! An industry standard ~300kHz, ~40N/m, ~100um long, uncoated rectangular cantilever paired with a 15um tall and 8nm radius tip. Get the best tapping mode topography and phase images on everything from polymers to ceramics, metals to semiconductors. Compatible with all AFMs.

 

Probe part numbers ending in -V2 provide:

Tighter dimensional specifications for improved probe to probe consistency

More precise alignment of the tip to the cantilever apex

Improved aesthetics

 

Most customers buy the AL coated version for greater sum signal: TESPA-V2.  

View...
TESPA-V2

TESPA-V2 is our best performing, best selling, non-rotated tapping mode probe! An industry standard ~300kHz, ~40N/m, ~100um long, Al coated rectangular cantilever paired with a 15um tall and 8nm radius tip. Get the best tapping mode topography and phase images on everything from polymers to ceramics, metals to semiconductors. Compatible with all AFMs.

 

Probe part numbers ending in -V2 provide:

Tighter dimensional specifications for improved probe to probe consistency

More precise alignment of the tip to the cantilever apex

Improved aesthetics


View...
Price: $735.00 (USD)
Sold in packs of 10
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Probe Selection Guide
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Overview

Super Sharp TESP probe based off of our TESP-V2 probe with super sharp spike tip.  The small spike Si processed to <10 degree half angles for the first 200 nm of the tip apex.

  • 42 N/m, 320 kHz
  • 2-5nm Tip Radius of Curvature
  • 10-pack of probes.

Tip Specification
TESP-V2-SS Tip Image
2-5nm Tip Radius of Curvature. Super sharp spike tip. The small spike is silicon tip processed to <10deg half angles for the first 200nm of the tip apex.
Tip Height (h): 12.5 µm
Front Angle (FA): 25.0º
Back Angle (BA): 17.5 º
Side Angle (SA): 20 .0º
Cantilever Specification
TESP-V2-SS Cantilever Image
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3.3µm
Cantilever Thickness (RNG): 2.8 - 3.8µm
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