Your shopping cart is currently empty.
TESP-V2
Geometry
RectangularTip Radius (nm)
Nom: 7
Max: 10
Frequency (KHz)
Nom: 320
Min: 270
Max: 370
Length (µm)
Nom: 123
Min: 120
Max: 125
Spring Const (N/m)
Nom: 37
Min: 19
Max: 55
Width (µm)
Nom: 40
Min: 37
Max: 42
Order a free TESP-V2 sample
Price: $367.50 (USD)
Sold in packs of 10
Questions? Free, Online Consulting
Overview
TESP-V2 is our best performing, best selling, non-rotated tapping mode probe! An industry standard ~300kHz, ~40N/m, ~100um long, uncoated rectangular cantilever paired with a 15um tall and 8nm radius tip. Get the best tapping mode topography and phase images on everything from polymers to ceramics, metals to semiconductors. Compatible with all AFMs.
Probe part numbers ending in -V2 provide:
Tighter dimensional specifications for improved probe to probe consistency
More precise alignment of the tip to the cantilever apex
Improved aesthetics
Most customers buy the AL coated version for greater sum signal: TESPA-V2.
Tip Specification
Tip Height (h): 10 - 15 µm
Front Angle (FA): 25 ± 2.5ºº
Back Angle (BA): 17.5 ± 2.5ºº
Side Angle (SA): 20 ± 2.5ºº
Cantilever Specification
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3.3µm
Cantilever Thickness (RNG): 2.8 - 3.8µm