SNL-10

Bruker's robust Silicon Nitride AFM probes have soft Silicon Nitride cantilevers with Silicon Nitride tips, and are ideal for contact imaging modes, lateral force microscopy,force modulation microscopy, and liquid operation.  The range in force constants enables users to image extremely soft samples in contact mode as well as high load vs distance spectroscopy.

Each unmounted probe comes with four different cantilevers of various dimensions, resulting in four unique nominal values for force constant and resonant frequency.  The DNP-10 cantilever layout consists of an "A"and "B" cantilevers on one side of the probe, and "C" and "D" cantilevers on the other side of the probe.  See the cantilever orientation diagram here.  All cantilevers on the Silicon Nitride probes have less than 2 degrees of cantilever bend. 

For a probe with considerably sharper Silicon tips on the same cantilever layout, please see model SNL-10.View...

A wafer of Silicon Nitride Probes
Premium Contact Mode or Fluid TappingMode imaging and force measurement probes, sharpened for higher-resolution.  Unmounted for BioScope / Dimension AFMs.
Quantity=380
*Due to the inherent danger of mishandling or contamination during extraction of probes by non-Bruker personnel, we do not guarantee performance of wafers once opened at the consumers site.  Instead, we highly recommend buying in larger quantities of 10-packs to guarantee performance, taking advantage of bulk discount pricing.View...

Bruker's sharpened Microlever AFM probes have soft Silicon Nitride cantilevers with sharpened Silicon Nitride tips. They are ideal for contact imaging modes, force modulation microscopy, and liquid operation.  The range in force constants enables users to image extremely soft samples in contact mode as well as high load vs distance spectroscopy.

Each unmounted probe comes with six different cantilevers of various dimensions, resulting in six unique nominal values for force constant and resonant frequency.  The MSCT cantilever layout consists of an "A" cantilevers on one side of the probe, and "B," "C," "D," "E," and "F" cantilevers on the other side of the probe.  See the cantilever orientation diagram here.  All cantilevers on the sharpened Microlever probes have less than 2 degrees of cantilever bend. 

For a probe with considerably sharper Silicon tips on the same cantilever layout, please see model MSNL-10.View...

Bruker's Sharp Microlever (MSNL) probes are the industry standard for high-performance imaging with TappingMode in fluid.  These probes marry the sharpness of a Silicon tip with the low spring constant and high sensitivity of a Silicon Nitride cantilever, for an unprecedented level of high-resolution and force control on just about any sample, in any medium.  The unique design of each MSNL probe includes six cantilevers with varying degrees of force constants and resonant frequencies, providing enough versatility to cover a large majority of sample types.

The MSNL cantilever layout is identical to that of the other MLCT products, with an "A" cantilevers on one side of the probe, and "B," "C," "D," "E," and "F" cantilevers on the other side of the probe.  See the cantilever orientation diagram here. All cantilevers on the MSNL probes have <2 degrees of cantilever bend, making them ideal for use on all Bruker and non-Bruker AFMs.View...