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DNP-10
Geometry
A TriangularTip Radius (nm)
Nom: 20
Max: 60
Frequency (KHz)
Nom: 65
Min: 50
Max: 80
Length (µm)
Nom: 120
Min: 115
Max: 125
Spring Const (N/m)
Nom: 0.35
Min: 0.175
Max: 0.7
Width (µm)
Nom: 25
Min: 20
Max: 30
Geometry
B Triangular
Tip Radius (nm)
Nom: 20
Max: 60
Frequency (KHz)
Nom: 23
Min: 16
Max: 28
Length (µm)
Nom: 205
Min: 200
Max: 210
Spring Const (N/m)
Nom: 0.12
Min: 0.06
Max: 0.24
Width (µm)
Nom: 40
Min: 35
Max: 45
Geometry
C Triangular
Tip Radius (nm)
Nom: 20
Max: 60
Frequency (KHz)
Nom: 56
Min: 40
Max: 75
Length (µm)
Nom: 120
Min: 115
Max: 120
Spring Const (N/m)
Nom: 0.24
Min: 0.12
Max: 0.48
Width (µm)
Nom: 20
Min: 15
Max: 25
Geometry
D Triangular
Tip Radius (nm)
Nom: 20
Max: 60
Frequency (KHz)
Nom: 18
Min: 12
Max: 24
Length (µm)
Nom: 205
Min: 200
Max: 210
Spring Const (N/m)
Nom: 0.06
Min: 0.03
Max: 0.12
Width (µm)
Nom: 25
Min: 20
Max: 30
Order a free DNP-10 sample
Price: $250.00 (USD)
Sold in packs of 10
Questions? Free, Online Consulting
Overview
Bruker's robust Silicon Nitride AFM probes have soft Silicon Nitride cantilevers with Silicon Nitride tips, and are ideal for contact imaging modes, lateral force microscopy,force modulation microscopy, and liquid operation. The range in force constants enables users to image extremely soft samples in contact mode as well as high load vs distance spectroscopy.
Each unmounted probe comes with four different cantilevers of various dimensions, resulting in four unique nominal values for force constant and resonant frequency. The DNP-10 cantilever layout consists of an "A"and "B" cantilevers on one side of the probe, and "C" and "D" cantilevers on the other side of the probe. See the cantilever orientation diagram here. All cantilevers on the Silicon Nitride probes have less than 2 degrees of cantilever bend.
For a probe with considerably sharper Silicon tips on the same cantilever layout, please see model SNL-10.
Each unmounted probe comes with four different cantilevers of various dimensions, resulting in four unique nominal values for force constant and resonant frequency. The DNP-10 cantilever layout consists of an "A"and "B" cantilevers on one side of the probe, and "C" and "D" cantilevers on the other side of the probe. See the cantilever orientation diagram here. All cantilevers on the Silicon Nitride probes have less than 2 degrees of cantilever bend.
For a probe with considerably sharper Silicon tips on the same cantilever layout, please see model SNL-10.
Tip Specification
Tip Height (h): 2.5 - 8.0 µm
Front Angle (FA): 15 ± 2.5º
Back Angle (BA): 25 ± 2.5º
Side Angle (SA): 17.5 ± 2.5º
Cantilever Specification
Material: Silicon Nitride
Geometry: Triangular
Cantilevers Number: 4
Cantilever Thickness (Nom): 0.6µm
Cantilever Thickness (RNG): 0.55 - 0.65µm
Back Side Coating: Reflective Gold
Top Layer Back: 45 ± 5 nm of Ti/Au