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MSCT
Geometry
A TriangularTip Radius (nm)
Nom: 10
Max: 40
Frequency (KHz)
Nom: 22
Min: 15
Max: 30
Length (µm)
Nom: 175
Min: 170
Max: 180
Spring Const (N/m)
Nom: 0.07
Min: 0.025
Max: 0.14
Width (µm)
Nom: 22
Min: 17
Max: 27
Geometry
B Rectangular
Tip Radius (nm)
Nom: 10
Max: 40
Frequency (KHz)
Nom: 15
Min: 10
Max: 20
Length (µm)
Nom: 210
Min: 205
Max: 215
Spring Const (N/m)
Nom: 0.02
Min: 0.005
Max: 0.04
Width (µm)
Nom: 20
Min: 15
Max: 25
Geometry
C Triangular
Tip Radius (nm)
Nom: 10
Max: 40
Frequency (KHz)
Nom: 7
Min: 4
Max: 10
Length (µm)
Nom: 310
Min: 305
Max: 315
Spring Const (N/m)
Nom: 0.01
Min: 0.005
Max: 0.02
Width (µm)
Nom: 20
Min: 15
Max: 25
Geometry
D Triangular
Tip Radius (nm)
Nom: 10
Max: 40
Frequency (KHz)
Nom: 15
Min: 10
Max: 20
Length (µm)
Nom: 225
Min: 220
Max: 230
Spring Const (N/m)
Nom: 0.03
Min: 0.01
Max: 0.06
Width (µm)
Nom: 20
Min: 15
Max: 25
Geometry
E Triangular
Tip Radius (nm)
Nom: 10
Max: 40
Frequency (KHz)
Nom: 38
Min: 26
Max: 50
Length (µm)
Nom: 140
Min: 135
Max: 145
Spring Const (N/m)
Nom: 0.1
Min: 0.05
Max: 0.2
Width (µm)
Nom: 18
Min: 13
Max: 23
Geometry
F Triangular
Tip Radius (nm)
Nom: 10
Max: 40
Frequency (KHz)
Nom: 125
Min: 90
Max: 160
Length (µm)
Nom: 85
Min: 80
Max: 90
Spring Const (N/m)
Nom: 0.6
Min: 0.3
Max: 1.2
Width (µm)
Nom: 18
Min: 13
Max: 23
Order a free MSCT sample
Price: $341.78 (USD)
Sold in packs of 10
Questions? Free, Online Consulting
Overview
Bruker's sharpened Microlever AFM probes have soft Silicon Nitride cantilevers with sharpened Silicon Nitride tips. They are ideal for contact imaging modes, force modulation microscopy, and liquid operation. The range in force constants enables users to image extremely soft samples in contact mode as well as high load vs distance spectroscopy.
Each unmounted probe comes with six different cantilevers of various dimensions, resulting in six unique nominal values for force constant and resonant frequency. The MSCT cantilever layout consists of an "A" cantilevers on one side of the probe, and "B," "C," "D," "E," and "F" cantilevers on the other side of the probe. See the cantilever orientation diagram here. All cantilevers on the sharpened Microlever probes have less than 2 degrees of cantilever bend.
For a probe with considerably sharper Silicon tips on the same cantilever layout, please see model MSNL-10.
Each unmounted probe comes with six different cantilevers of various dimensions, resulting in six unique nominal values for force constant and resonant frequency. The MSCT cantilever layout consists of an "A" cantilevers on one side of the probe, and "B," "C," "D," "E," and "F" cantilevers on the other side of the probe. See the cantilever orientation diagram here. All cantilevers on the sharpened Microlever probes have less than 2 degrees of cantilever bend.
For a probe with considerably sharper Silicon tips on the same cantilever layout, please see model MSNL-10.
Tip Specification
Tip Height (h): 2.5 - 8.0 µm
Front Angle (FA): 15 ± 2.5º
Back Angle (BA): 25 ± 2.5º
Side Angle (SA): 17.5 ± 2.5º
Cantilever Specification
Material: Silicon Nitride
Geometry: Rectangular & Triangular
Cantilevers Number: 6
Cantilever Thickness (Nom): 0.55µm
Cantilever Thickness (RNG): 0.5 - 0.6µm
Back Side Coating: Reflective Gold