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AFM Probes, Tips and Cantilevers

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NEW! App Note: Nanomechanical Characterization with AFM

This application note describes the nanoscale mechanical properties routinely measured with an AFM, including elastic modulus, viscoelastic properties, friction, and adhesion. Exploring Nanomechanical Characterization with AFM: Measuring Elastic Modulus, Viscoelastic Properties, Friction, and Adhesion The ability to characterize a variety of nanoscale properties together with topography in any environment is key to the power and broad applicability of atomic force microscopy. While accessing properties in the realm of electrical, thermal, chemical, and electrochemical measurements is also common, the atomic force microscope (AFM) is best known for its unique ability to measure mechanical properties. This application note provides an overview of nanomechanical characterization with an AFM, focusing on measurements of the most broadly applicable mechanical properties on the nanoscale: elastic modulus, viscoelastic properties, friction, and adhesion. The measurements described go beyond general mechanical contrast to provide semiquantitative and quantitative information about individual mechanical properties.   Readers can expect to: Gain a framework for categorizing and understanding the various mechanical AFM modes Find descriptions of each mechanical property category, accessible for even the AFM novice See examples from each property category, showcasing real samples and data CLICK HERE TO READ THE APP NOTE  
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NEW! App Note: Torsional Resonance Modes

This application note describes how to resolve in-plane properties and enable atomic-resolution AFM imaging with TR-Mode and its derivatives. Exploring the Capabilities of Torsional Resonance-Based AFM Modes for High-Resolution Imaging and Property Extraction Torsional resonance (TR) modes use horizontal probe actuation (parallel to the surface). Lateral forces between tip and sample cause a change in cantilever resonance behavior that can be used to track the surface at a constant distance, or to extract sample property information. Torsional resonance mode (TR-Mode) was initially developed for AFM topographical imaging, but its value is now much broader. In this application note Bruker experts describe the operation and applications of torsional resonance modes, from the original TR-Mode to the newly developed torsional resonance dynamic friction microscopy (TR-DFM).   Readers can expect to: Understand why TR-based modes can resolve in-plane anisotropy and measure dynamic friction See how TR-DFM introduces the ability to image atomic lattice structures, even for 2D materials Discover how combining the TR modulation with other modes results in unique imaging and analysis capabilities   CLICK HERE TO READ THE APP NOTE
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Watch Now: 2024 AFM Probes Showdown

Our AFM experts talk about their favorite probes and the best tips, tricks, and practical guidance for AFM users. The full-length recording of this webinar is now available on-demand. Discover the keys to AFM success, according to our experts. In this webinar, we interview various Bruker application engineers worldwide on what their favorite, go-to probes are and why. We also virtually visit various demonstration labs to get tips and tricks from dedicated BioAFM, nanoIR, and automated AFM application engineers. Watch the recording to hear Bruker’s applications and demonstration-lab atomic force microscopy experts answer these questions: What is your favorite AFM probe and why? What applications- and technique-specific tips and tricks do you have?    You can find the full on-demand recording of the webinar here.
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OTESPA is back in stock!

Two of our most popular visible-tip probes are back in stock: OLTESPA-R3 and OTESPA-R4! Get yours today. OTESPA is back in stock! Two of our most popular visible-tip probes are back in stock: OLTESPA-R3 and OTESPA-R4! Get yours today. These probes allow you to reliably target any point of interest. Just align the free end of the cantilever with the sample feature of interest when in the navigation GUI of your AFM, and hit Engage. Since the tip is located directly beneath the cantilever apex, it will land in the perfect position every time.  Both probes feature tetrahedral sharpened tips with 7 nm tip radii for crisp topographic images. OLTESPA-R3 has a 70 kHz frequency and 2 N/m spring constant, while OTESPA-R4 has a 300 kHz nominal frequency and 26 N/m spring constant, making them a perfect pairing for a wide range of polymeric, metallic, semiconductor, ceramic, and similar samples.   Get yours while they're still in stock!        Need help selecting the ideal probe for your application? Choosing the ideal AFM probe for your application can be difficult, but Bruker's AFM experts are here to help! Contact us today to discuss your research goals and learn which probes will optimize your results.  
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NEW! Spherical Probes for BioAFM

Designed for life science microrheology applications and quantitative nanomechanical mapping on biological samples. Bruker has introduced sphere tip versions of our popular MLCT and SAA probes.  These novel BioAFM probes are designed specifically for life science microrheology applications and quantitative nanomechanical mapping of living cells, tissues, hydrogels, and other biological samples. Spherical probes have a known geometry that's good for modeling to get mechanical properties. Different sizes are good for different samples/applications, providing flexibility.   Learn more about our spherical probes here: MLCT-SPH-1UM MLCT-SPH-1UM-DC MLCT-SPH-5UM MLCT-SPH-5UM-DC MLCT-SPH-10UM MLCT-SPH-10UM-DC SAA-SPH-1UM SAA-SPH-5UM SAA-SPH-10UM          
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