TESPAW-V2
Geometry
RectangularTip Radius (nm)
Nom: 7
Max: 10
Frequency (KHz)
Nom: 320
Min: 270
Max: 370
Length (µm)
Nom: 123
Min: 120
Max: 125
Spring Const (N/m)
Nom: 37
Min: 19
Max: 55
Width (µm)
Nom: 40
Min: 37
Max: 42
Price: $6,463.80 (USD)
Sold in packs of 375
Questions? Free, Online Consulting
Overview
A wafer of high quality, etched silicon probes for TappingMode™ and other non-contact modes. Unmounted for use on standard AFM's.
Bruker AFM Probes has introduced an improved version of its popular,TESP/TESPA AFM probes. Bruker’s new line of TESP high quality premiumetched silicon probes set the industry standard for TappingMode™ and non-contact mode in air.
The new design provides:
• Tighter dimensional specifications for improved probe to probe consistency
• Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
• Improved probe quality & aesthetics
This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model TESPW-V2.
The current model TESPAW is available for ordering through early 2014 at which point, it will become obsolete.
Bruker AFM Probes has introduced an improved version of its popular,TESP/TESPA AFM probes. Bruker’s new line of TESP high quality premiumetched silicon probes set the industry standard for TappingMode™ and non-contact mode in air.
The new design provides:
• Tighter dimensional specifications for improved probe to probe consistency
• Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
• Improved probe quality & aesthetics
This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model TESPW-V2.
The current model TESPAW is available for ordering through early 2014 at which point, it will become obsolete.