APMC-0001

Bruker's sharpened Microlever AFM probes have soft Silicon Nitride cantilevers with sharpened Silicon Nitride tips. They are ideal for contact imaging modes, force modulation microscopy, and liquid operation.  The range in force constants enables users to image extremely soft samples in contact mode as well as high load vs distance spectroscopy.

Each unmounted probe comes with six different cantilevers of various dimensions, resulting in six unique nominal values for force constant and resonant frequency.  The MSCT cantilever layout consists of an "A" cantilevers on one side of the probe, and "B," "C," "D," "E," and "F" cantilevers on the other side of the probe.  See the cantilever orientation diagram here.  All cantilevers on the sharpened Microlever probes have less than 2 degrees of cantilever bend. 

For a probe with considerably sharper Silicon tips on the same cantilever layout, please see model MSNL-10.View...

The Unmounted Chip Carrier Toolkit, for Innova/CP-II, provides the hardware and tools for mounting unmounted probes on a chip carrier. The toolkit includes a chip carrier (model 00-107-0091), chip mounting fixture, cantilever and wafer tool kit (model 1550-00). The Unmounted Chip Carrier Toolkit is included in all Innova systems.View...