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TESP-SS
Geometry
RectangularTip Radius (nm)
Nom: 2
Max: 5
Frequency (KHz)
Nom: 320
Min: 230
Max: 410
Length (µm)
Nom: 125
Min: 140
Max: 110
Spring Const (N/m)
Nom: 42
Min: 20
Max: 80
Width (µm)
Nom: 30
Min: 25
Max: 35
Order a free TESP-SS sample
Price: $787.50 (USD)
Sold in packs of 10
Questions? Free, Online Consulting
Overview
Super Sharp TESP Probe
- 42N/m, 320kHz
- 2-5nm Tip Radius of Curvature
- Super sharp spike tip. The small spike is silicon tip processed to <10deg half angles for the first 200nm of the tip apex.
- 10-Pack of Probes
- 42N/m, 320kHz
- 2-5nm Tip Radius of Curvature
- Super sharp spike tip. The small spike is silicon tip processed to <10deg half angles for the first 200nm of the tip apex.
- 10-Pack of Probes
Tip Specification
Tip Height (h): 10 - 15 µm
Front Angle (FA): 25 ± 2.5º
Back Angle (BA): 15 ± 2.5º
Side Angle (SA): 22.5 ± 2.5º
Cantilever Specification
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 4µm
Cantilever Thickness (RNG): 3.5 - 4.5µm