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HAR1-200-10
Geometry
RectangularTip Radius (nm)
Nom: 10
Max: 15
Frequency (KHz)
Nom: 320
Min: 270
Max: 400
Length (µm)
Nom: 117
Min: 115
Max: 120
Spring Const (N/m)
Nom: 40
Min: 20
Max: 75
Width (µm)
Nom: 33
Min: 28
Max: 38
Order a free HAR1-200-10 sample
Price: $1,155.00 (USD)
Sold in packs of 10
Questions? Free, Online Consulting
Overview
A pack of High Aspect Ratio Probes.
Tilt-Compensated High Aspect Ratio (5:1) Focused Ion Beam (FIB) probes for high resolution TappingMode imaging on samples with tall/deep geometries. Unmounted for all AFMs.
Quantity=10
Tilt-Compensated High Aspect Ratio (5:1) Focused Ion Beam (FIB) probes for high resolution TappingMode imaging on samples with tall/deep geometries. Unmounted for all AFMs.
Quantity=10
Tip Specification
High aspect ratio probe based upon Bruker technology and made from our TESP. Aspect ratio of 5:1 at 1um from tip apex.
Tip Height (h): 10 - 15 µm
Front Angle (FA): 5 ± 0.5º
Back Angle (BA): 5 ± 0.5º
Side Angle (SA): 5 ± 0.5º
Cantilever Specification
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3.5µm
Cantilever Thickness (RNG): 2.8-4.2µm