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PCB-1M-UW

3 Total Related Products
PCB-1M-004
Current In-Plane Tunneling (CIPT) uses a four-point probe setup to determine characteristic properties of tunnel junctions by measuring resistance at different probe spacings. There are a number of different probe types available to enable the measurement of a large range of samples and wafers.
 
The Narrow Probe is available on either a ceramic carrier or, as is the case for the PCB-1M-004, on the PCB carrier for SmartProber Instruments. Other options include either a Au coating or a Pt coating on the pins.  Pt coating probes have higher lifetimes than that Au, at the cost of a higher contact resistance.
 

PCB-1M-004

Details:

Probe type Carrier Tip coating Min. mean probe distance Max. mean probe distance
 Narrow PCB Au  1.5 μm 8.3 μm


Distance between adjacent pins in μm:

1-2 2-3 3-4 4-5 5-6 6-7 7-8 8-9 9-10 10-11 11-12
4.5 3 1.5 1.5 1.5 1.5 1.75 2 2.25 2.5 2.75

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PCB-1M-007
Current In-Plane Tunneling (CIPT) uses a four-point probe setup to determine characteristic properties of tunnel junctions by measuring resistance at different probe spacings. There are a number of different probe types available to enable the measurement of a large range of samples and wafers.
 
The Standard Probe is available on either a ceramic carrier or, as is the case for the PCB-1M-007, on the PCB carrier for SmartProber Instruments. Other options include either a Au coating or a Pt coating on the pins.  Pt coating probes have higher lifetimes than that Au, at the cost of a higher contact resistance.
 

PCB-1M-007

Details:

Probe type Carrier Tip coating Min. mean probe distance Max. mean probe distance
 Standard PCB Au  1.5 μm 18.5 μm


Distance between adjacent pins in μm:

1-2 2-3 3-4 4-5 5-6 6-7 7-8 8-9 9-10 10-11 11-12
9.6 9.3 4.5 3 1.5 1.5 1.5 1.5 5 5.7 12.4

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PCB-1M-005
Current In-Plane Tunneling (CIPT) uses a four-point probe setup to determine characteristic properties of tunnel junctions by measuring resistance at different probe spacings. There are a number of different probe types available to enable the measurement of a large range of samples and wafers.
 
The Wide Probe is available with a Au coating on the pins, on either a ceramic carrier or, as is the case for the PCB-1M-005, on the PCB carrier for SmartProber Instruments.
 

PCB-1M-005

Details:

Probe type Carrier Tip coating Min. mean probe distance Max. mean probe distance
 Wide PCB Au  3.0 μm 59 μm


Distance between adjacent pins in μm:

1-2 2-3 3-4 4-5 5-6 6-7 7-8 8-9 9-10 10-11 11-12
60 24 15 6 3 3 3 3 9 12 39

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Overview
The Ultrawide probe boasts very large pin spacings designed to measure magnetic tunnel junctions with large RA-products, conveniently bridging the gap between Wide CIPT probes and macroscopic sheet resistance probes.
 
 Ultrawide probes have 16 pins instead of the usual 12, offering the largest pin spacing range of any CIPT probe without compromising on resolution. Fewer probe type changes will be needed while measuring a wider variety of junctions. The wider pin spacing also allows for sturdier pins, leading to a longer expected lifetime than their 12 pin counterparts.

The Ultrawide Probe is uniquely available on SmartProber CIPT systems.
 

PCB-1M-UW

Details:

Probe type Carrier Tip coating Min. mean probe distance Max. mean probe distance
 Standard PCB Pt  12 μm 450 μm


Distance between adjacent pins in μm:

1-2 2-3 3-4 4-5 5-6 6-7 7-8 8-9 9-10 10-11 11-12 12-13  13-14  14-15  15-16 
263 142 77 41 22 12 12 12 12 16 30 56  104  193  358 

Tip Specification
PCB-1M-UW Tip Image
Cantilever Specification
PCB-1M-UW Cantilever Image
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