FASTSCAN-A -G

These probes are FASTSCAN-A but with a Au reflex coating instead of Al.

FASTSCAN-A-G probes deliver extreme imaging speed without loss of resolution or force control!

Designed specifically for use with the Dimension FastScan AFM but can be used on other high speed AFM systems.

Perform high resolution imaging and collect best quality data at line rates up to 20Hz. Scan up tp 100Hz on suitably flat samples.

FASTSCAN-A-G probes use a novel ~30um triangular SiN lever with a high 1.4MHz frequency but just a 17N/m spring constant meaning wide compatibility with multiple sample types from polymers to semiconductor samples. A 5nm tip radius is optimally balanced for great resolution and longevity.

All FastScan cantilevers have less that 3 degrees of cantilever bend.  Using this probe on an AFM other than the Dimension FastScan is not recommended and will result in sub-optimal performance.

Download the datasheet for more information.