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Probes → CER-2M-007

CER-2M-007

CER-2M-007 View Larger
3 Total Related Products
PCB-1M-005
Current In-Plane Tunneling (CIPT) uses a four-point probe setup to determine characteristic properties of tunnel junctions by measuring resistance at different probe spacings. There are a number of different probe types available to enable the measurement of a large range of samples and wafers.
 
The Wide Probe is available with a Au coating on the pins, on either a ceramic carrier or, as is the case for the PCB-1M-005, on the PCB carrier for SmartProber Instruments.
 

PCB-1M-005

Details:

Probe type Carrier Tip coating Min. mean probe distance Max. mean probe distance
 Wide PCB Au  3.0 μm 59 μm


Distance between adjacent pins in μm:

1-2 2-3 3-4 4-5 5-6 6-7 7-8 8-9 9-10 10-11 11-12
60 24 15 6 3 3 3 3 9 12 39

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CER-2M-004
Current In-Plane Tunneling (CIPT) uses a four-point probe setup to determine characteristic properties of tunnel junctions by measuring resistance at different probe spacings. There are a number of different probe types available to enable the measurement of a large range of samples and wafers.
 
The Narrow Probe is available on either a ceramic carrier, as is the case for the CER-2M-004, or on the PCB carrier for SmartProber Instruments. Other options include either a Au coating or a Pt coating on the pins.  Pt coating probes have higher lifetimes than that Au, at the cost of a higher contact resistance.
 

CER-1M-004

Details:

Probe type Carrier Tip coating Min. mean probe distance Max. mean probe distance
 Narrow Ceramic Pt  1.5 μm 8.3 μm


Distance between adjacent pins in μm:

1-2 2-3 3-4 4-5 5-6 6-7 7-8 8-9 9-10 10-11 11-12
4.5 3 1.5 1.5 1.5 1.5 1.75 2 2.25 2.5 2.75

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CER-2M-008
Current In-Plane Tunneling (CIPT) uses a four-point probe setup to determine characteristic properties of tunnel junctions by measuring resistance at different probe spacings. There are a number of different probe types available to enable the measurement of a large range of samples and wafers.
 
The Nano Probe is available with Pt coating on the pins, on either a ceramic carrier, as is the case for the CER-2M-008, or on the PCB carrier for SmartProber Instruments.
 

CER-2M-008

Details:

Probe type Carrier Tip coating Min. mean probe distance Max. mean probe distance
 Standard Ceramic Pt  0.75 μm 5.87 μm


Distance between adjacent pins in μm:

1-2 2-3 3-4 4-5 5-6 6-7 7-8 8-9 9-10 10-11 11-12
2.25 1.5 0.75 0.75 0.75 0.75 1.443 1.036 1.852 3.124 3.395

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Overview
Current In-Plane Tunneling (CIPT) uses a four-point probe setup to determine characteristic properties of tunnel junctions by measuring resistance at different probe spacings. There are a number of different probe types available to enable the measurement of a large range of samples and wafers.
 
The Standard Probe is available on either a ceramic carrier, as is the case for the CER-2M-007, or on the PCB carrier for SmartProber Instruments. Other options include either a Au coating or a Pt coating on the pins.  Pt coating probes have higher lifetimes than that Au, at the cost of a higher contact resistance.
 

PCB-2M-007

Details:

Probe type Carrier Tip coating Min. mean probe distance Max. mean probe distance
 Standard Ceramic Pt  1.5 μm 18.5 μm


Distance between adjacent pins in μm:

1-2 2-3 3-4 4-5 5-6 6-7 7-8 8-9 9-10 10-11 11-12
9.6 9.3 4.5 3 1.5 1.5 1.5 1.5 5 5.7 12.4

Tip Specification
CER-2M-007 Tip Image
Cantilever Specification
CER-2M-007 Cantilever Image
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