Skip to Main Content
Close
0
Probes → PCB-2M-008

PCB-2M-008

PCB-2M-008 View Larger
2 Total Related Products
PCB-2M-004
Current In-Plane Tunneling (CIPT) uses a four-point probe setup to determine characteristic properties of tunnel junctions by measuring resistance at different probe spacings. There are a number of different probe types available to enable the measurement of a large range of samples and wafers.
 
The Narrow Probe is available on either a ceramic carrier or, as is the case for the PCB-2M-004, on the PCB carrier for SmartProber Instruments. Other options include either a Au coating or a Pt coating on the pins.  Pt coating probes have higher lifetimes than that Au, at the cost of a higher contact resistance.
 

PCB-2M-004

Details:

Probe type Carrier Tip coating Min. mean probe distance Max. mean probe distance
 Narrow PCB Pt  1.5 μm 8.3 μm


Distance between adjacent pins in μm:

1-2 2-3 3-4 4-5 5-6 6-7 7-8 8-9 9-10 10-11 11-12
4.5 3 1.5 1.5 1.5 1.5 1.75 2 2.25 2.5 2.75

View...
PCB-2M-007
Current In-Plane Tunneling (CIPT) uses a four-point probe setup to determine characteristic properties of tunnel junctions by measuring resistance at different probe spacings. There are a number of different probe types available to enable the measurement of a large range of samples and wafers.
 
The Standard Probe is available on either a ceramic carrier or, as is the case for the PCB-2M-007, on the PCB carrier for SmartProber Instruments. Other options include either a Au coating or a Pt coating on the pins.  Pt coating probes have higher lifetimes than that Au, at the cost of a higher contact resistance.
 

PCB-2M-007

Details:

Probe type Carrier Tip coating Min. mean probe distance Max. mean probe distance
 Standard PCB Pt  1.5 μm 18.5 μm


Distance between adjacent pins in μm:

1-2 2-3 3-4 4-5 5-6 6-7 7-8 8-9 9-10 10-11 11-12
9.6 9.3 4.5 3 1.5 1.5 1.5 1.5 5 5.7 12.4

View...
Questions? Free, Online Consulting
+1 (800) 715-8440
Overview
Current In-Plane Tunneling (CIPT) uses a four-point probe setup to determine characteristic properties of tunnel junctions by measuring resistance at different probe spacings. There are a number of different probe types available to enable the measurement of a large range of samples and wafers.
 
The Nano Probe is available with Pt coating on the pins, on either a ceramic carrier or, as is the case for the PCB-2M-008, on the PCB carrier for SmartProber Instruments.
 

PCB-2M-008

Details:

Probe type Carrier Tip coating Min. mean probe distance Max. mean probe distance
 Standard PCB Pt  0.75 μm 5.87 μm


Distance between adjacent pins in μm:

1-2 2-3 3-4 4-5 5-6 6-7 7-8 8-9 9-10 10-11 11-12
2.25 1.5 0.75 0.75 0.75 0.75 1.443 1.036 1.852 3.124 3.395

Tip Specification
PCB-2M-008 Tip Image
Cantilever Specification
PCB-2M-008 Cantilever Image
© 2024 Bruker AFM Probes, All Rights Reserved.
Loading...