DDRFESP40

Bruker's popular DDESP-FM-V2 electrical probe provide both fantastic wear resistance and robust conductivity due to the hard and highly conductive tip side doped diamond coating.

Perfect for applications such as C-AFM and PeakForce TUNA, SCM, SSRM, and PFM.

For a stiffer cantilever version of this probe see DDESP-V2.

Probe part numbers ending in -V2 provide:

Tighter dimensional specifications for improved probe to probe consistency

More precise alignment of the tip to the cantilever apex

Improved aesthetics

Bruker’s new series of conductive diamond coated probes provide consistent performance with high wear resistance in mechanical and electrical applications. In mechanical applications, these probes provide extreme wear resistance.

In electrical applications, these probes provide high performance in Scanning Spreading Resistance Microscopy (SSRM) and Piezoresponse Force Microscopy (PFM) to characterize advanced semiconductor devices, Microelectromechanical Systems (MEMS), and biosensors providing the prolonged tip lifetime in combination with boosted conductivity.

The DDLTESP-V2 probe provides:

• High performance contact resonance imaging with Dimension Icon

• High electrical performance due to its consistent tip shape

• Sensitive nanoelectrical measurements with highly conductive coating

• High resolution electrical imaging with a sharp conductive tip

• High quality probe manufactured by Bruker AFM Probes

• High spring constant for contact resonance on hardest materials such s ceramics

Other applications of this probe include: Scanning Capacitance Microscopy (SCM), conductivity measurements (C-AFM and PeakForce TUNA), and other electrical characterization applications.