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ESP-V2

ESP-V2
Geometry
Rectangular
Tip Radius (nm)
Nom: 8
Max: 12
Frequency (KHz)
Nom: 13
Min: 9
Max: 17
Length (µm)
Nom: 450
Min: 440
Max: 460
Spring Const (N/m)
Nom: 0.2
Min: 0.05
Max: 0.4
Width (µm)
Nom: 50
Min: 48
Max: 52
2 Total Related Products
CONTV
A pack of Silicon Probes.
Quantity=10

Bruker's Value Line of Contact Mode in air ONLY probes.  This probe is also available with an Aluminum reflex coating as model CONTV-A.

Specifications:
- 0.2N/m, 13kHz, No Reflective Coating.
- Unmounted for use on any AFM.

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ESPA-V2
A pack of 10 High quality etched silicon probes for contact mode imaging in air.  Unmounted for use on standard AFM's.   Bruker’s line of ESP high quality premium etched silicon probes set the industry standard for contact mode in air.   

The probe design provides:
•         Tighter dimensional specifications for improved probe to probe consistency
•         Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
•         Improved probe quality & aesthetics  

This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model ESP-V2.

View...
Price: $357.00 (USD)
Sold in packs of 10
+
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Shipping Info
Probe Selection Guide
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+1 (800) 715-8440
Overview
A pack of 10 High quality etched silicon probes for contact mode imaging in air.   This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model ESPA-V2.
 
Tip Specification
ESP-V2 Tip Image
Tip Height (h): 10 - 15 µm
Front Angle (FA): 25 ± 2.5º
Back Angle (BA): 15 ± 2.5º
Side Angle (SA): 22.5 ± 2.5º
Cantilever Specification
ESP-V2 Cantilever Image
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2µm
Cantilever Thickness (RNG): 1.25 - 2.75µm
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