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NCLV-AW
Geometry
RectangularTip Radius (nm)
Nom: 8
Frequency (KHz)
Nom: 190
Min: 130
Max: 250
Length (µm)
Nom: 225
Min: 200
Max: 250
Spring Const (N/m)
Nom: 48
Min: 24
Max: 96
Width (µm)
Nom: 38
Min: 33
Max: 43
Price: $5,190.00 (USD)
Sold in packs of 375
Questions? Free, Online Consulting
Overview
A pack of Silicon Probes.
Quantity=Wafer
Bruker's Value Line Long-Lever TappingMode™ imaging probes, with reflective coating. This probe is also available without Aluminum reflex coating as model NCLV-W.
Specifications:
- 48N/m, 190kHz, Al Reflective Coating.
- Unmounted for use on any AFM.
Quantity=Wafer
Bruker's Value Line Long-Lever TappingMode™ imaging probes, with reflective coating. This probe is also available without Aluminum reflex coating as model NCLV-W.
Specifications:
- 48N/m, 190kHz, Al Reflective Coating.
- Unmounted for use on any AFM.
Tip Specification
Tip Height (h): 10 - 15 µm
Front Angle (FA): 25 ± 2.5ºº
Back Angle (BA): 15 ± 2.5ºº
Side Angle (SA): 22.5 ± 2.5ºº
Cantilever Specification
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 7µm
Cantilever Thickness (RNG): 6.5 - 7.5µm