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Mode → Chemical Force Microscopy (CFM)

Chemical Force Microscopy (CFM)

Chemical Force Microscopy (CFM) combines the force sensitivity and high special resolution of the atomic force microscope (AFM) with the possibility of chemical discrimination. This unique combination is achieved by well-defined chemical modification of the AFM probe tip with specific functional groups.
ST-PNP-COOH
Frequency
Nom: 67KHz
Spring Const.
Nom: 0.32N/m
Geometry
A - Triangular
Tip Radius
40nm
CALL TO ORDER
ST-PNP-CH3
Frequency
Nom: 67KHz
Spring Const.
Nom: 0.32N/m
Geometry
A - Triangular
Tip Radius
40nm
CALL TO ORDER
ST-PNP-OH
Frequency
Nom: 67KHz
Spring Const.
Nom: 0.32N/m
Geometry
A - Triangular
Tip Radius
40nm
CALL TO ORDER
ST-PNP-NH2
Frequency
Nom: 67KHz
Spring Const.
Nom: 0.32N/m
Geometry
A - Triangular
Tip Radius
40nm
CALL TO ORDER
ST-PNP-CF3
Frequency
Nom: 67KHz
Spring Const.
Nom: 0.32N/m
Geometry
A - Triangular
Tip Radius
40nm
CALL TO ORDER
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