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Visible Apex
The tetrahedral tip of the visible apex probes allows for exact positioning of the probe tip on the sample surface. The tip is located on the very end of the cantilever, which enables the tip to be set over a point of interest on the sample, easily and precisely. This probe is especially effective when using an AFM combined with an optical microscope.
Frequency
Nom: 300KHz
Spring Const.
Nom: 26N/m
Geometry
Rectangular
Tip Radius
7nmMaterial
0.01 - 0.02 Ωcm SiliconCoating
B: Reflective Aluminum
Frequency
Nom: 70KHz
Spring Const.
Nom: 2N/m
Geometry
Rectangular
Tip Radius
7.0nmMaterial
0.01 - 0.02 Ωcm SiliconCoating
B: Reflective Al