Contact MPP

The MPP Contact cantilevers are designed for high resolution contact mode imaging.  Every aspect of the MPP design has been considered and optimized to provide the most accurate profiling of microscopic features.  With precisely controlled cantilever geometry to enable repeatable scanning parameters, and an extra sharp tip radius to reduce the AFM's minimum detectable feature size, Veeco's flagship MPP probes are an excellent choice for high sensitivity silicon probe imaging.