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RTESPA-300

RTESPA-300
Geometry
Rectangular
Tip Radius (nm)
Nom: 8
Max: 12
Frequency (KHz)
Nom: 300
Min: 200
Max: 400
Length (µm)
Nom: 125
Min: 115
Max: 135
Spring Const (N/m)
Nom: 40
Min: 20
Max: 80
Width (µm)
Nom: 40
Min: 38
Max: 42
2 Total Related Products
RTESP-300
RTESP-300 is our best performing, best selling tapping mode probe! An industry standard 300kHz, 40N/m, ~100um long, rectangular cantilever paired with a rotated, 15um tall and 8nm radius tip. Get the best tapping mode topography and phase images on everything from polymers to ceramics, metals to semiconductors. Compatible with all AFM   

This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model RTESPA-300. Download the datasheet to learn more.

 

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RTESPA-300-30

Building on Bruker’s flagship series of Tapping probes with rotated tip, the RTESPA-300-30 provides accurate nanomechanical mapping on stiff samples in air with controlled end radius and laser Doppler vibrometer calibrated spring constants.

End radii are controlled to 30nm +/- 15%. Spring constants are individually calibrated and guaranteed within 10% . Parameters are contained in the QR code on the box for fast and error free reading with the QR reader included with Bruker’s new PeakForce QNM high accuracy kit available for Dimension Icon. The high nominal 40N/m spring constant is most suitable for stiff (typically GPa) samples. For other samples, see the whole series of calibrated probes.

- Nanomechanical mapping with FFV or PFQNM on Dimension Icon
- Controlled 30nm end radius
- Individually calibrated spring constant, 40N/m nominal
- Parameters contained in QR code
- One pack of 5 probes

Download the datasheet to learn more.


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Order a free RTESPA-300 sample
Price: $404.25 (USD)
Sold in packs of 10
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Overview
RTESPA-300 is our best performing, best selling tapping mode probe! An industry standard 300kHz, 40N/m, ~100um long, rectangular cantilever paired with a rotated, 15um tall and 8nm radius tip. Get the best tapping mode topography and phase images on everything from polymers to ceramics, metals to semiconductors. Compatible with all AFM

This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model RTESP-300. Download the datasheet to learn more.
Tip Specification
RTESPA-300 Tip Image
This probe uses a rotated tip to provide a more symmetric representation of features over 200nm.
Tip Height (h): 10 - 15 µm
Front Angle (FA): 15 ± 2º
Back Angle (BA): 25 ± 2º
Side Angle (SA): 17.5 ± 2º
Cantilever Specification
RTESPA-300 Cantilever Image
Aluminum reflective coating on the backside of the cantilever. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers, highly reflective samples, and machine vision applications.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3.4µm
Cantilever Thickness (RNG): 2.65 µm - 4.15µm
Back Side Coating: Reflective Aluminum
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