Your shopping cart is currently empty.
RTESP-300
Geometry
RectangularTip Radius (nm)
Nom: 8
Max: 12
Frequency (KHz)
Nom: 300
Min: 200
Max: 400
Length (µm)
Nom: 125
Min: 115
Max: 135
Spring Const (N/m)
Nom: 40
Min: 20
Max: 80
Width (µm)
Nom: 40
Min: 38
Max: 42
Price: $393.75 (USD)
Sold in packs of 10
Questions? Free, Online Consulting
Overview
RTESP-300 is our best performing, best selling tapping mode probe! An industry standard 300kHz, 40N/m, ~100um long, rectangular cantilever paired with a rotated, 15um tall and 8nm radius tip. Get the best tapping mode topography and phase images on everything from polymers to ceramics, metals to semiconductors. Compatible with all AFM
This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model RTESPA-300. Download the datasheet to learn more.
This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model RTESPA-300. Download the datasheet to learn more.
Tip Specification
Tip Height (h): 10 - 15 µm
Front Angle (FA): 15 ± 2º
Back Angle (BA): 25 ± 2º
Side Angle (SA): 17.5 ± 2º
Cantilever Specification
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3.4µm
Cantilever Thickness (RNG): 2.65 - 4.15µm