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TappingMode/ Non-Contact
TappingMode™ AFM, a proprietary Bruker afm mode, is the most popular AFM technique. As an AC technique, the cantilever is operated at or near its resonance frequency such that forces between the AFM tip and sample cause a change of the initial resonance behavior. It is common to reduce the free air amplitude in order to maintain sample topography tracking. A phase image can also be generated by simultaneously monitoring the phase shift between drive signal to the AFM cantilever and its response. This allows for very high spatial information based on various material properties.
Frequency
Nom: 525KHz
Spring Const.
Nom: 200N/m
Geometry
Rectangular
Tip Radius
30nmMaterial
0.01 - 0.025 Ωcm Antimony (n) doped SiCoating
B: Reflective Aluminum
Frequency
Nom: 320KHz
Spring Const.
Nom: 40N/m
Geometry
Rectangular
Tip Radius
10nmMaterial
0.01 - 0.025 Ωcm Antimony (n) doped Si
Frequency
Nom: 75KHz
Spring Const.
Nom: 2.8N/m
Geometry
Rectangular
Tip Radius
8nmMaterial
0.01 - 0.025 Ωcm Antimony (n) doped Si
Frequency
Nom: 190KHz
Spring Const.
Nom: 35N/m
Geometry
Rectangular
Tip Radius
8nmMaterial
0.01 - 0.025 Ωcm Antimony (n) doped SiCoating
B: Reflective Aluminum
Frequency
Nom: 75KHz
Spring Const.
Nom: 3N/m
Geometry
Rectangular
Tip Radius
8nmMaterial
0.01 - 0.025 Ωcm Antimony (n) doped SiCoating
B: Reflective Aluminum
Frequency
Nom: 150KHz
Spring Const.
Nom: 5N/m
Geometry
Rectangular
Tip Radius
30nmMaterial
0.01 - 0.025 Ωcm Antimony (n) doped SiCoating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 26N/m
Geometry
Rectangular
Tip Radius
7nmMaterial
0.01 - 0.02 Ωcm SiliconCoating
B: Reflective Aluminum
Frequency
Nom: 320KHz
Spring Const.
Nom: 37N/m
Geometry
Rectangular
Tip Radius
7nmMaterial
0.01 - 0.025 Ωcm Antimony (n) doped Si Coating
B: Reflective Aluminum