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PCB-2M-008

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Overview
Current In-Plane Tunneling (CIPT) uses a four-point probe setup to determine characteristic properties of tunnel junctions by measuring resistance at different probe spacings. There are a number of different probe types available to enable the measurement of a large range of samples and wafers.
 
The Nano Probe is available with Pt coating on the pins, on either a ceramic carrier or, as is the case for the PCB-2M-008, on the PCB carrier for SmartProber Instruments.
 

PCB-2M-008

Details:

Probe type Carrier Tip coating Min. mean probe distance Max. mean probe distance
 Standard PCB Pt  0.75 μm 5.87 μm


Distance between adjacent pins in μm:

1-2 2-3 3-4 4-5 5-6 6-7 7-8 8-9 9-10 10-11 11-12
2.25 1.5 0.75 0.75 0.75 0.75 1.443 1.036 1.852 3.124 3.395

Tip Specification
PCB-2M-008 Tip Image
Cantilever Specification
PCB-2M-008 Cantilever Image
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